Structure and proximity effects in (twisted) multilayer graphene (S3)

Project description

In recent years, twisted graphene layers have attracted great interest because they can realize a multitude of correlated electronic phases. This project will introduce twisted multilayer graphene, and with it the relatively young field of twistronics, to FOR5242. We will fabricate twisted multilayer graphene, both by epitaxial growth and exfoliation-based techniques and will make samples available to the FOR partners for further sample processing (e.g. intercalation) and investigations in all other projects. For characterization of the fabricated twisted graphenes as well as for samples provided by the collaboration partners, we will primarily use x-ray standing waves (XSW) and various scanning probe microscopy (SPM) techniques. With XSW we will measure interlayer distances, which is in many cases a very important parameter for judging the interlayer (de)coupling, and – for commensurate structures – we will resolve the lateral structure with XSW imaging, most importantly the adsorption sites of (intercalated) species with respect to the substrate lattice. Using SPM, we will investigate the surface structure of intercalated (and twisted) graphene prepared within the consortium and characterize its electronic properties down to mK temperatures. We will further perform nanoscale transport measurements in form of scanning tunneling potentiometry (STP), continuing the activities of project E3 (Wenderoth) from the first funding period, which will phase out in the second period due to the PI’s retirement.


Composition of the project group


Project-related publications

Solving the Phase Problem of Diffraction: X-ray Standing Waves Imaging on Bismuthene/SiC(0001)

N. Tilgner, S. Wolff, S. Soubatch, T.-L. Lee, F. Göhler, F. S. Tautz, T. Seyller, P. Schädlich, C. Kumpf , 2D Materials 12, 045020 (2025)

DOI-Link

Christian Kumpf
FZ Jülich
+49 2461 61-1452
c.kumpf@fz-juelich.de

https://www.fz-juelich.de/en/pgi/pgi-3/groups/diffraction-methods-and-electron-microscopy

Felix Lüpke
FZ Jülich
+49 2461 61-6977
f.luepke@fz-juelich.de

https://www.fz-juelich.de/en/pgi/pgi-3/groups/layered-quantum-systems

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